Automatic defect detection of patterned fabric via combining the optimal gabor filter and golden image subtraction
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作者:
Jing, Junfeng
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School of Electronic and Information, Xi'an Polytechnic University, Xi'an, ChinaSchool of Electronic and Information, Xi'an Polytechnic University, Xi'an, China
Jing, Junfeng
[1
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Chen, Shan
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School of Electronic and Information, Xi'an Polytechnic University, Xi'an, ChinaSchool of Electronic and Information, Xi'an Polytechnic University, Xi'an, China
Chen, Shan
[1
]
Li, Pengfei
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School of Electronic and Information, Xi'an Polytechnic University, Xi'an, ChinaSchool of Electronic and Information, Xi'an Polytechnic University, Xi'an, China
Li, Pengfei
[1
]
机构:
[1] School of Electronic and Information, Xi'an Polytechnic University, Xi'an, China