Two-step generalized phase-shifting profilometry by grating projection

被引：0
|
作者：
Zhou, Can-Lin [1 ]
Si, Shu-Chun [1 ]
Gao, Cheng-Yong [1 ]
Lei, Zhen-Kun [2 ]
机构：
[1] School of Physics, Shandong University, Jinan 250100, China
[2] Department of Engineering Mechanics, Dalian University of Technology, Dalian 116024, China
来源：
Guangdianzi Jiguang/Journal of Optoelectronics Laser | 2013年 / 24卷 / 09期
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页码：1784 / 1788
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