Joint spectral and spatial quality evaluation of pan-sharpening methods

被引：0
|
作者：
Shah, Vijay P. [1 ,2 ,3 ]
Younan, Nicolas H. [1 ,2 ]
King, Roger L. [1 ,2 ]
机构：
[1] Department of Electrical and Computer Engineering, Mississippi State, MS 39762, United States
[2] GeoResources Institute, Mississippi State University, Starkville, MS 39759, United States
[3] SAIC-Frederick, Inc., National Cancer Institute, Bethesda, MD 20892, United States
来源：
Journal of Applied Remote Sensing | 2008年 / 2卷 / 01期
关键词：
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