Multifractal characterization of single wall carbon nanotube thin films surface upon exposure to optical parametric oscillator laser irradiation

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[1] Ţəlu, Ştefan
[2] Marković, Zoran
[3] Stach, Sebastian
[4] Todorović Marković, B.
[5] Ţəlu, Mihai
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Ţəlu, Ştefan (stefan_ta@yahoo.com) | 1600年 / Elsevier B.V., Netherlands卷 / 289期
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Atomic force microscopy;
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