Fault-Tolerant Design and Testing of USB2.0 Peripheral Devices IP Core System

被引：0
|
作者：
Bai, Xiaoping [1 ,2 ]
Wei, Yuanfeng [2 ]
机构：
[1] School of Management, Xi'an University of Architecture and Technology, Xi'an, 710055, China
[2] School of Electronics and Information Engineering, Xi'an Jiaotong University, Xi'an, 710049, China
来源：
Tsinghua Science and Technology | 2007年 / 12卷 / SUPPL. 1期
关键词：
16;
D O I：
10.1016/S1007-0214(07)70109-8
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：197 / 201
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