An AFM's operation mode based on spatial frequency characteristics of surface profile

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作者：
School of Mechatronics Engineering, Harbin Institute of Technology, Harbin 150001, China [1 ]
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来源：
Nami Jishu yu Jingmi Gongcheng | 2008年 / 4卷 / 293-296期
关键词：
Atomic force microscopy;
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