Edge-enhanced soft X-ray phase-contrast microscopy exploiting the near K-edge optical properties of carbon

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[1] Domondon, Andrew
[2] Bokor, Nandor
[3] Iketaki, Yoshinori
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Domondon, A. (domondon@aoni.waseda.jp) | 1600年 / Institute of Electrical Engineers of Japan卷 / 134期
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10.1541/ieejeiss.134.521
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