Development of high-resolution imaging of solid-liquid interface by frequency modulation atomic force microscopy

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作者：
JEOL Ltd., Akishima, Tokyo 196-8558, Japan [1 ]
不详 [2 ]
不详 [3 ]
不详 [4 ]
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来源：
Jpn. J. Appl. Phys. | / 8 PART 4卷
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Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
08LB12
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摘要：
Air conditioning - Liquids - Frequency modulation - Polypropylenes - Q factor measurement - Phase interfaces
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