X-ray diffraction study of nanocrystalline tungsten nitride and tungsten to 31 GPa

被引：0

作者：

Ma, Yanzhang ^{[1
]}

Cui, Qiliang ^{[2
]}

Shen, Longhai ^{[2
]}

He, Zhaoming ^{[1
]}

机构：

[1] Department of Mechanical Engineering, Texas Tech University, Lubbock, TX 79409, United States

[2] National Laboratory of Superhard Materials, Jilin University, Changchun 130012, China

来源：

Journal of Applied Physics | 2007年 / 102卷 / 01期

关键词：

X-ray diffraction measurement determined that a newly synthesized nanocrystalline tungsten nitride (W2 N) has a substantially larger cell parameter than its bulk material. Yet the lattice of a metal nanocrystalline tungsten (W) remained unchanged. High-pressure diffraction study to 31 GPa resolved a much lower bulk modulus of 240 GPa for nanocrystalline W2 N and a relatively unchanged bulk modulus of 307 GPa for nanocrystalline W compared to its bulk material. We found that the metallic bonding of a metal is not affected by reduction of the grain size. The enlarged cell parameter and the relatively low bulk modulus of W2 N reflect the size effect of nanocrystalline W2 N. © 2007 American Institute of Physics;

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摘要：

Journal article (JA)

引用

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