Effect of surface oxidation on electron transport in InN thin films

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作者：
Lebedev, V. [1 ]
Wang, Ch.Y. [1 ]
Cimalla, V. [1 ]
Hauguth, S. [1 ]
Kups, T. [1 ]
Ali, M. [1 ]
Ecke, G. [1 ]
Himmerlich, M. [1 ]
Krischok, S. [1 ]
Schaefer, J.A. [1 ]
Ambacher, O. [1 ]
Polyakov, V.M. [2 ]
Schwierz, F. [2 ]
机构：
[1] Institute of Micro- and Nanotechnologies, Technical University Ilmenau, PB 100565, 98693 Ilmenau, Germany
[2] Department of Solid State Electronics, Technical University Ilmenau, PB 100565, 98684 Ilmenau, Germany
来源：
Journal of Applied Physics | 2007年 / 101卷 / 12期
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