Atomistic simulation of environment-assisted crack propagation behavior of SiO2

被引：0
|
作者：
Yasukawa, Akio [1 ]
机构：
[1] Hitachi, Ltd., Automotive Systems, 2520 Takaba, Hitachinaka-shi, Ibaraki, 312-8503, Japan
来源：
Nihon Kikai Gakkai Ronbunshu, A Hen/Transactions of the Japan Society of Mechanical Engineers, Part A | 2009年 / 75卷 / 755期
关键词：
D O I：
10.1299/kikaia.75.866
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学科分类号：
摘要：
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页码：866 / 872
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