Fault diagnosis technology based on SVM in power electronics circuit

被引：0
|
作者：
Hu, Qing [1 ]
Wang, Rong-Jie [1 ]
Zhan, Yi-Ju [2 ]
机构：
[1] School of Information Engineering, Guangdong University of Technology, Guangzhou 510006, China
[2] School of Engineering, Sun Yat-Sen University, Guangzhou 510275, China
来源：
Zhongguo Dianji Gongcheng Xuebao/Proceedings of the Chinese Society of Electrical Engineering | 2008年 / 28卷 / 12期
关键词：
16;
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暂无
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学科分类号：
摘要：
引用
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页码：107 / 111
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