Surface and interface analysis of Rubrene/TPD using AFM and XPS

被引：0
|
作者：
Leng, Chong-Qian [1 ]
Li, Hai-Rong [1 ]
Li, Yao [1 ]
Gao, Peng-Jie [1 ]
机构：
[1] Institute of Microelectronics, School of Physical Science and Technology, Lanzhou University, Lanzhou 730000, China
来源：
Gongneng Cailiao/Journal of Functional Materials | 2010年 / 41卷 / SUPPL. 2期
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页码：349 / 352
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