Real-time X-ray scattering studies on temperature dependence of perfluoropentacene thin film growth

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机构：
[1] Frank, C.
[2] Novák, J.
[3] Gerlach, A.
[4] Ligorio, G.
[5] Broch, K.
[6] Hinderhofer, A.
[7] Aufderheide, A.
[8] Banerjee, R.
[9] Nervo, R.
[10] Schreiber, F.
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| 1600年 / American Institute of Physics Inc.卷 / 114期
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X ray scattering;
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