1.5MeV proton irradiation effects on electrical and structural properties of TiO2/n-Si interface

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[1] Ishfaq, M.
[2] Rizwan Khan, M.
[3] Bhopal, M.F.
[4] Nasim, F.
[5] Ali, A.
[6] Bhatti, A.S.
[7] Ahmed, I.
[8] Bhardwaj, Sunil
[9] Cepek, Cinzia
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| 1600年 / American Institute of Physics Inc.卷 / 115期
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