Robust ultrathin oxynitride with high nitrogen diffusion barrier near its surface formed by NH3 nitridation of chemical oxide and reoxidation with O2

被引:0
|
作者
Lai, Chiung Hui [1 ,2 ]
Lin, Bo Chun [3 ]
Chang, Kow Ming [1 ]
Hsieh, Kuang Yeu [4 ]
Lai, Yi Lung [5 ]
机构
[1] Department of Electronics Engineering, Institute of Electronics, National Chiao-Tung University, Hsin-Chu, Taiwan
[2] Department of Electrical Engineering, Chung Chou Institute of Technology, Yuanlin Changhwa 510, Taiwan
[3] Department of Electronic Engineering, Northern Taiwan Institute of Science and Technology, Taipei 112, Taiwan
[4] Nano-technology R and D Division, Emerging Central Laboratory, Macronix International Co., Ltd., Hsinchu, 300, Taiwan
[5] Department of Electronic Engineering, National Taiwan University of Science and Technology, Taipei, Taiwan
关键词
We have proposed an approach for growing robust ultrathin oxynitride using conventional thermal processes with the capability of preventing boron penetration. In this method; we obtain oxynitride with high nitrogen concentration (13 at. %) on the top and low interface state density (D it = 2 × 1010 cm-2 eV-1). The films demonstrate excellent properties in terms of low Dit; low leakage current; high endurance in stressing and superior boron diffusion blocking behavior. This method does not involve any additional capital equipment [such as decoupled plasma nitridation (DPN) or remote plasma nitridation (RPN)] or gas (NO or N2O). In addition; it obtains high-quality oxynitride film with low thermal budget. Most importantly; this process is simple and fully compatible with current process technology. It would be important and interesting for process engineers engaged in the field of gate dielectrics. It is suitable for the next generation of ULSI technology. © 2006 The Japan Society of Applied Physics;
D O I
暂无
中图分类号
学科分类号
摘要
Journal article (JA)
引用
收藏
页码:4898 / 4902
相关论文
共 17 条
  • [11] Synthesis and characterizations of zinc oxide nanoparticles and its ability to detect O2 and NH3 gases (vol 6, 101064, 2023)
    Al-darwesh, Mouhaned Y.
    Ibrahim, Sattar S.
    Naief, Mohammed Faiad
    Mohammed, Ahmed Mishaal
    Chebbi, Hammouda
    RESULTS IN CHEMISTRY, 2024, 7
  • [12] Low temperature growth (400°C) of high-integrity thin silicon-oxynitride films by microwave-excited high-density Kr/O2/NH3 plasma
    Ohtsubo, K
    Saito, Y
    Hirayama, M
    Sugawa, S
    Aharoni, H
    Ohmi, T
    22ND CONVENTION OF ELECTRICAL AND ELECTRONICS ENGINEERS IN ISRAEL, PROCEEDINGS, 2002, : 166 - 169
  • [13] Controllable synthesis of α-Fe2O3 nanotubes with high surface area: preparation, growth mechanism, and its catalytic performance for the selective catalytic reduction of NO with NH3
    Lingjuan Ma
    Hongbin Ma
    Nanxing Gao
    Jiaomei Wang
    Xuqin Zhang
    Journal of Materials Science, 2016, 51 : 1959 - 1965
  • [14] Controllable synthesis of α-Fe2O3 nanotubes with high surface area: preparation, growth mechanism, and its catalytic performance for the selective catalytic reduction of NO with NH3
    Ma, Lingjuan
    Ma, Hongbin
    Gao, Nanxing
    Wang, Jiaomei
    Zhang, Xuqin
    JOURNAL OF MATERIALS SCIENCE, 2016, 51 (04) : 1959 - 1965
  • [15] Electrical and optical properties of nitrogen-incorporated silicon-oxide films by using plasma-enhanced chemical-vapor deposition with tetra methoxysilane/N2O/NH3 gas
    Chung, C. J.
    Chung, T. H.
    Kang, M. S.
    Kim, Y.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2006, 49 (01) : 162 - 166
  • [16] Effects of surface treatments using O3 and NH3 on electrical properties and chemical structures of high-k HfO2 dielectric films on strained Si1-xGex/Si substrates
    Park, Tae Joo
    Kim, Jeong Hwan
    Jang, Jae Hyuck
    Na, Kwang Duk
    Hwang, Cheol Seong
    Won, Jeong Yeon
    JOURNAL OF APPLIED PHYSICS, 2008, 103 (08)
  • [17] InAIN/GaN metal-oxide-semiconductor high electron mobility transistor with Al2O3 insulating films grown by metal organic chemical vapor deposition using Ar and NH3 carrier gases
    Cico, K.
    Kuzmik, J.
    Liday, J.
    Husekova, K.
    Pozzovivo, G.
    Carlin, J. -F.
    Grandjean, N.
    Pogany, D.
    Vogrincic, P.
    Froehlich, K.
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2009, 27 (01): : 218 - 222