Genetic algorithm based partition design for test (DFT)

被引：0
|
作者：
Li, Yu-Fei [1 ]
Yu, Zhou [1 ]
Fu, Yu-Zhuo [1 ]
机构：
[1] School of Microelectronics, Shanghai Jiaotong Univ., Shanghai 200240, China
来源：
Shanghai Jiaotong Daxue Xuebao/Journal of Shanghai Jiaotong University | 2007年 / 41卷 / 11期
关键词：
16;
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中图分类号：
学科分类号：
摘要：
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页码：1774 / 1777
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