An X-ray diffractometer using mirage diffraction

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[1] Fukamachi, Tomoe
[2] Jongsukswat, Sukswat
[3] Ju, Dongying
[4] Negishi, Riichirou
[5] Hirano, Keiichi
[6] Kawamura, Takaaki
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Fukamachi, T. (tomoe-f@wonder.ocn.ne.jp) | 1600年 / International Union of Crystallography, 5 Abbey Road, Chester, CH1 2HU, United Kingdom卷 / 47期
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Some characteristics are reported of a triple-crystal diffractometer with a (+; em-; em+) setting of Si(220) using mirage diffraction. The first crystal is flat; while the second and third crystals are bent. Basically; the first crystal is used as a collimator; the second as a monochromator and the third as the sample. The third crystal also works as an analyzer. The advantages of this diffractometer are that its setup is easy; its structure is simple; the divergence angle from the second crystal is small and the energy resolution of the third crystal is high; of the order of sub-meV. © 2014 International Union of Crystallography;
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