High-speed spectrometer using KTN optical beam scanner

被引：0
|
作者：
Sasaki, Yuzo [1 ,2 ]
机构：
[1] Advanced Opto-Electronics Laboratory, NTT Photonics Laboratories, Japan
[2] NTT Photonics Laboratories, Atsugi-shi, 243-0198, Japan
来源：
NTT Technical Review | 2009年 / 7卷 / 12期
关键词：
Scanning - Tantalum compounds - Niobium compounds;
D O I：
暂无
中图分类号：
TN2 [光电子技术、激光技术];
学科分类号：
0803 ; 080401 ; 080901 ;
摘要：
This article describes a spectrometer fabricated using a combination of a KTa1-xNbxO3 (KTN) optical beam scanner and a wavelength dispersion element. This spectrometer can measure a wide optical spectrum in microsecond-order time. A high-speed spectrometer is now being developed to observe ultrafast luminous phenomena.
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