Photoluminescence properties of Si-based CeO2 films

被引:0
|
作者
Wang, Shen-Wei [1 ]
Yi, Li-Xin [1 ]
Ding, Jia-Cheng [1 ]
Gao, Jing-Xin [1 ]
Wang, Yong-Sheng [1 ]
机构
[1] Key Laboratory of Luminescence and Optical Information, Ministry of Education, Institute of Optoelectronic Technology, Beijing Jiaotong University, Beijing 100044, China
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:762 / 766
相关论文
共 50 条
  • [31] Strong ultraviolet and violet photoluminescence from Si-based anodic porous alumina films
    J.H. Wu
    X.L. Wu
    N. Tang
    Y.F. Mei
    X.M. Bao
    Applied Physics A, 2001, 72 : 735 - 737
  • [32] Strong ultraviolet and violet photoluminescence from Si-based anodic porous alumina films
    Wu, JH
    Wu, XL
    Tang, N
    Mei, YF
    Bao, XM
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2001, 72 (06): : 735 - 737
  • [33] PROPERTIES OF CEO2 AND CEO2-X FILMS .1. PREPARATION AND CRYSTALLOGRAPHIC PROPERTIES
    SCHWAB, RG
    STEINER, RA
    MAGES, G
    BEIE, HJ
    THIN SOLID FILMS, 1992, 207 (1-2) : 283 - 287
  • [34] XPS studies on the interaction of CeO2 with silicon in magnetron sputtered CeO2 thin films on Si and Si3N4 substrates
    Anandan, C.
    Bera, Parthasarathi
    APPLIED SURFACE SCIENCE, 2013, 283 : 297 - 303
  • [35] PROPERTIES OF CEO2 AND CEO2-X FILMS .2. HIGH-TEMPERATURE PROPERTIES
    SCHWAB, RG
    STEINER, RA
    MAGES, G
    BEIE, HJ
    THIN SOLID FILMS, 1992, 207 (1-2) : 288 - 293
  • [36] Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopy
    Jones, JT
    Bridger, PM
    Marsh, OJ
    McGill, TC
    APPLIED PHYSICS LETTERS, 1999, 75 (09) : 1326 - 1328
  • [37] Charge storage in CeO2/Si/CeO2/Si(111) structures by electrostatic force microscopy
    Jones, J.T.
    Bridger, P.M.
    Marsh, O.J.
    McGill, T.C.
    Applied Physics Letters, 75 (09):
  • [38] Electronic Conductivity and Dielectric Properties of Nanocrystalline CeO2 Films
    Jyrki Lappalainen
    Harry L. Tuller
    Vilho Lantto
    Journal of Electroceramics, 2004, 13 : 129 - 133
  • [39] The Oxygen Permeation Properties of Nanocrystalline CeO2 Thin Films
    Brinkman, K. S.
    Takamura, H.
    Tuller, H. L.
    Iijima, T.
    JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 2010, 157 (12) : B1852 - B1857
  • [40] Electronic conductivity and dielectric properties of nanocrystalline CeO2 films
    Lappalainen, J
    Tuller, HL
    Lantto, V
    JOURNAL OF ELECTROCERAMICS, 2004, 13 (1-3) : 129 - 133