The oriented Partial Differential Equation based on the Discontinuities Measure for electronic speckle pattern interferometry

被引：0
|
作者：
机构：
[1] Xiao, Zhi-Tao
[2] Yuan, Quan
[3] Zhang, Fang
[4] Wu, Jun
[5] Geng, Lei
[6] Feng, Tie-Jun
[7] Chen, Ying
[8] Wang, Dan-Yu
来源：
Zhang, Fang | 1600年 / Science Press卷 / 36期
关键词：
D O I：
10.3724/SP.J.1146.2013.01814
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [31] FRINGE CONTRAST IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    WYKES, C
    BUTTERS, JN
    JONES, R
    APPLIED OPTICS, 1981, 20 (05): : A50 - 721
  • [32] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI)-BASED RESEARCH METHODS IN ELECTROACOUSTICS
    VOLLESEN, JH
    NDT INTERNATIONAL, 1988, 21 (06): : 393 - 396
  • [33] OPTIMUM DETERMINATION OF SPECKLE SIZE TO BE USED IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    YOSHIMURA, T
    ZHOU, M
    YAMAHAI, K
    LIYAN, Z
    APPLIED OPTICS, 1995, 34 (01): : 87 - 91
  • [34] Application of interferometry and electronic speckle pattern interferometry (ESPI) for measurements on MEMS
    Engelsberger, J
    Nösekabel, EH
    Steinbichler, M
    FRINGE 2005, 2006, : 488 - +
  • [35] Analysis of Fatigue of Metals by Electronic Speckle Pattern Interferometry
    Hasegawa, Shun
    Sasaki, Tomohiro
    Yoshida, Sanichiro
    Hebert, Seth L.
    ADVANCEMENT OF OPTICAL METHODS IN EXPERIMENTAL MECHANICS, VOL 3, 2015, : 127 - 134
  • [36] Vibration analysis of logs with electronic speckle pattern interferometry
    Applied Optics Group, Department of Physics, Norwegian Univ. of Sci. and Technol., N-7034 Trondheim, Norway
    不详
    Appl. Opt., 16 (3649-3656):
  • [37] Multiplicative electronic speckle-pattern interferometry fringes
    Ochoa, NA
    Santoyo, FM
    López, CP
    Barrientos, B
    APPLIED OPTICS, 2000, 39 (28) : 5138 - 5141
  • [38] Infrared electronic speckle pattern interferometry at 10 μm
    Vandenrijt, J. -F.
    Georges, M.
    OPTICAL MEASUREMENT SYSTEMS FOR INDUSTRIAL INSPECTION V, PTS 1 AND 2, 2007, 6616 : Q6162 - Q6162
  • [39] Electronic Speckle Pattern Interferometry for fatigue crack monitoring
    Farahani, Behzad, V
    Direito, Frederico
    Sousa, Pedro J.
    Tavares, Paulo J.
    Moreira, Pedro M. P. G.
    4TH INTERNATIONAL CONFERENCE ON STRUCTURAL INTEGRITY (ICSI 2021), 2022, 37 : 873 - 879
  • [40] LONG-DISTANCE ELECTRONIC SPECKLE PATTERN INTERFEROMETRY
    LOKBERG, OJ
    MALMO, JT
    OPTICAL ENGINEERING, 1988, 27 (02) : 150 - 156
12345