A method of test case generation based on necessary interval set

被引：0
|
作者：
Wang, Yawen [1 ,2 ]
Gong, Yunzhan [1 ]
Xiao, Qing [3 ]
机构：
[1] State Key Laboratory of Networking and Switching Technology, Beijing University of Posts and Telecommunications, Beijing 100876, China
[2] State Key Laboratory of Computer Architecture, Institute of Computing Technology, Chinese Academy of Sciences, Beijing 100190, China
[3] Department of Information Engineering, Academy of Armored Force Engineering, Beijing 100072, China
来源：
Jisuanji Fuzhu Sheji Yu Tuxingxue Xuebao/Journal of Computer-Aided Design and Computer Graphics | 2013年 / 25卷 / 04期
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页码：550 / 556
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