Research on energy-stored programmable 5.0 kA surge current testing equipment

被引：0
|
作者：
Dai, Juan [1 ]
Zhao, Zhihong [1 ]
机构：
[1] School of Energy and Electronical Engineering, Nanjing Institute of Industry Technology, 210023, China
来源：
International Journal of Hybrid Information Technology | 2013年 / 6卷 / 05期
关键词：
Microcomputers;
D O I：
10.14257/ijhit.2013.6.5.01
中图分类号：
学科分类号：
摘要：
引用
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页码：1 / 10
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