Determination of low atomic number elements by X-ray fluorescence fundamental parameter method

被引：0
|
作者：
Pavlinskii, G.V. [1 ]
Vladimirova, L.I. [1 ]
机构：
[1] Research Institute of Applied Physics, Irkutsk State University, bul'v. Gagarina 20, Irkutsk 664003, Russia
来源：
Journal of Analytical Chemistry | 2009年 / 64卷 / 03期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
Journal article (JA)
引用
收藏
页码：253 / 258
相关论文
共 50 条
  • [21] A comparison of the performance of a fundamental parameter method for analysis of total reflection X-ray fluorescence spectra and determination of trace elements, versus an empirical quantification procedure
    Wegrzynek, D
    Holynska, B
    Ostachowicz, B
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1998, 53 (01) : 43 - 48
  • [22] CHARACTERIZATION OF AN X-RAY SOURCE FOR THE FUNDAMENTAL PARAMETER METHOD
    POZSGAI, I
    X-RAY SPECTROMETRY, 1992, 21 (05) : 249 - 252
  • [23] Development of X-ray fluorescence holography method for determination of local atomic environment
    Hayashi, K
    Takahashi, Y
    Matsubara, E
    Kishimoto, S
    Mori, T
    Tanaka, M
    Hayakawa, S
    Suzuki, M
    PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II, 2001, : 567 - 570
  • [24] X-RAY ENERGIES FOR EFFECTIVE ATOMIC NUMBER DETERMINATION
    RUTHERFORD, RA
    PULLAN, BR
    ISHERWOOD, I
    NEURORADIOLOGY, 1976, 11 (01) : 23 - 28
  • [25] Fundamental parameters method for determination of rare earth elements in apatites by wavelength-dispersive X-ray fluorescence spectrometry
    Sitko, Rafal
    Zawisza, Beata
    Czaja, Maria
    Journal of Analytical Atomic Spectrometry, 2005, 20 (08): : 741 - 745
  • [26] Fundamental parameters method for determination of rare earth elements in apatites by wavelength-dispersive X-ray fluorescence spectrometry
    Sitko, R
    Zawisza, B
    Czaja, M
    JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2005, 20 (08) : 741 - 745
  • [27] Fundamental quantification procedure for total reflection X-ray fluorescence spectra analysis and elements determination
    Wegrzynek, D
    Holynska, B
    SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1997, 52 (07) : 915 - 921
  • [28] X-RAY PRODUCED AUGER ELECTRONS FROM ELEMENTS OF LOW + INTERMEDIATE ATOMIC NUMBER
    FAHLMAN, A
    NORDLING, C
    ARKIV FOR FYSIK, 1964, 26 (03): : 248 - &
  • [29] DETERMINATION OF RARE-EARTH ELEMENTS IN SOLUTIONS BY X-RAY FLUORESCENCE METHOD
    REKHKOLA.GI
    INDUSTRIAL LABORATORY, 1965, 31 (04): : 536 - &
  • [30] Experimental determination of the x-ray atomic fundamental parameters of nickel
    Menesguen, Y.
    Lepy, M-C
    Hoenicke, P.
    Mueller, M.
    Unterumsberger, R.
    Beckhoff, B.
    Hoszowska, J.
    Dousse, J-Cl
    Blachucki, W.
    Ito, Y.
    Yamashita, M.
    Fukushima, S.
    METROLOGIA, 2018, 55 (01) : 56 - 66
12345