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- [22] Characterization of Si nanocrystals embedded in SiO2 with X-ray photoelectron spectroscopy SCIENCE AND TECHNOLOGY OF NANOMATERIALS - ICMAT 2003, 2005, 23 : 11 - 14
- [30] Calculation of x-ray scattering patterns from nanocrystals at high x-ray intensity STRUCTURAL DYNAMICS-US, 2016, 3 (05):