Dynamic scan chain partitioning for reducing peak shift power during test

被引：0
|
作者：
Almukhaizim, Sobeeh [1 ]
Sinanoglu, Ozgur [2 ]
机构：
[1] Department of Computer Engineering, Kuwait University, Safat 13060, Kuwait
[2] Department of Mathematics and Computer Science, Kuwait University, Safat 13060, Kuwait
来源：
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 2009年 / 28卷 / 01期
关键词：
D O I：
10.1109/tcad.2008.2009159
中图分类号：
学科分类号：
摘要：
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页码：298 / 302
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