Flux flow velocity instability and quasiparticle relaxation time in nanocrystalline β-W thin films

被引:0
|
作者
Hofer, J.A. [1 ]
Haberkorn, N. [1 ,2 ]
机构
[1] Instituto Balseiro, Universidad Nacional de Cuyo and Comisión Nacional de Energía Atómica, Av. Bustillo 9500, San Carlos de Bariloche,8400, Argentina
[2] Comisión Nacional de Energía Atómica and Consejo Nacional de Investigaciones Científicas y Técnicas, Centro Atómico Bariloche, Av. Bustillo 9500, San Carlos de Bariloche,8400, Argentina
关键词
Flow velocity - Nanocrystals - Magnetic fields - Superconducting films - Vortex flow - Particle beams;
D O I
暂无
中图分类号
学科分类号
摘要
We characterized the superconducting properties of a micropatterned 23 nm thick β-W film using electrical transport measurements in magnetic fields. The film is nanocrystalline and displays a smooth surface. The superconducting critical temperature is 4.6 K. The critical current densities display a fast drop with the magnetic field, indicating weak vortex pinning. From the analysis of the instability in the vortex motion at low magnetic fields in the flux-flow state, we observe vortex velocities up 800 m/s. An inelastic lifetime of quasiparticles around 0.6 ns is estimated at low temperatures. Together with high uniformity in thickness and simplicity in the fabrication process, the superconducting properties make β-W films promising for applications in fast single-photon detectors. © 2021
引用
收藏
相关论文
共 50 条
  • [31] Local flux-flow instability in superconducting films near Tc
    Bezuglyj, Alexei, I
    Shklovskij, Valerij A.
    Vovk, Ruslan V.
    Bevz, Volodymyr M.
    Huth, Michael
    Dobrovolskiy, Oleksandr, V
    PHYSICAL REVIEW B, 2019, 99 (17)
  • [32] Microstructure, mechanical and electrical properties of nanocrystalline W-Mo thin films
    Martinez, G.
    Ramana, C. V.
    AIP ADVANCES, 2017, 7 (12):
  • [33] Microstructural evolution and electrical resistivity of nanocrystalline W thin films grown by sputtering
    Kim, Yong Jin
    Kang, Sung-Gyu
    Oh, Yeonju
    Kim, Gyu Won
    Cha, In Ho
    Han, Heung Nam
    Kim, Young Keun
    MATERIALS CHARACTERIZATION, 2018, 145 : 473 - 478
  • [34] Thermal stability of nanocrystalline W-Ti diffusion barrier thin films
    QingXiang Wang
    ZhiKang Fan
    ShuHua Liang
    Science China Technological Sciences, 2010, 53 : 1049 - 1055
  • [35] Thermal stability of nanocrystalline W-Ti diffusion barrier thin films
    Wang QingXiang
    Fan ZhiKang
    Liang ShuHua
    SCIENCE CHINA-TECHNOLOGICAL SCIENCES, 2010, 53 (04) : 1049 - 1055
  • [36] Thermal stability of nanocrystalline W-Ti diffusion barrier thin films
    WANG QingXiang
    Science China(Technological Sciences), 2010, (04) : 1049 - 1055
  • [37] Thermal stability of nanocrystalline W-Ti diffusion barrier thin films
    WANG QingXiangFAN ZhiKang LIANG ShuHua School of Materials Science and EngineeringXian University of TechnologyXian China
    Science China(Technological Sciences), 2010, 53 (04) : 1049 - 1055
  • [38] Structures and nanoindentation properties of nanocrystalline and amorphous Ta-W thin films
    Wang, C. L.
    Zhang, M.
    Chu, J. P.
    Nieh, T. G.
    SCRIPTA MATERIALIA, 2008, 58 (03) : 195 - 198
  • [39] FLUX FLOW IN THIN TYPE-I SUPERCONDUCTING FILMS
    THOLFSEN, P
    MEISSNER, H
    PHYSICAL REVIEW, 1969, 185 (02): : 653 - +
  • [40] Nanocrystalline tin oxide thin films via liquid flow deposition
    Supothina, S
    De Guire, MR
    Heuer, AH
    JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 2003, 86 (12) : 2074 - 2081