Effects of the grain size and orientation of Cu on the formation and growth behavior of intermetallic compounds in Sn-Ag-Cu solder joints

The rapid development of semiconductor packaging technology has accelerated the applications of flip-chip bonding technology using fine-pitch micro bumps and Cu pillar bumps. These micro-bump systems are composed of metallic Cu and Sn. The properties of the Cu- and Sn-based bonding materials applied in these technologies have a significant effect on the mechanical properties and long-term reliability of micro-joints. This study focuses on the effects of the grain size and orientation of the Cu substrate on the formation and growth of intermetallic compounds (IMCs) at the Sn/Cu interface. The Cu substrate was annealed from 200 to 1000 degrees C to alter its grain size, which was measured via electron backscatter diffraction analysis. Sn-3.0Ag-0.5Cu (SAC) solder paste was printed onto the Cu substrate, and the Sn/Cu interfacial microstructure was observed by scanning electron microscopy and energy-dispersive X-ray spectroscopy after the reflow soldering process. A thin IMC formed on substrates with small grain sizes, whereas larger grain sizes resulted in the formation of thick and elongated IMCs. In addition, the IMC growth exhibited a specific directional preference in the (2110) direction on substrates annealed at 1000 degrees C. The effects of the Cu grain size and orientation on the interfacial reactions and growth of IMCs were compared and analyzed by observing IMCs formed at the SAC/Cu interface. Microstructural analysis revealed that controlling the Cu grain size and orientation significantly impacts the reliability of the solder joints. This study shows that the effect of grain size and orientation can be utilized to micro-solder joints, which can significantly enhance their mechanical strength and reliability.