共 50 条
- [21] INS MODEL SYSTEM TEST PLAN REVIEW OF THE ELECTRICAL COMMUNICATIONS LABORATORIES, 1984, 32 (01): : 161 - 174
- [22] Bayesian Approach to Determine the Test Plan of Reliability Qualification Test ENGINEERING ASSET MANAGEMENT - SYSTEMS, PROFESSIONAL PRACTICES AND CERTIFICATION, 2015, : 1707 - 1714
- [25] Highly automated test chip layout and test plan development for parametric electrical test 2008 IEEE INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, CONFERENCE PROCEEDINGS, 2008, : 96 - 100
- [26] Analysis of test scheme for a Bayes plan of qualification Test in binomial case Xi Tong Gong Cheng Yu Dian Zi Ji Shu/Systems Engineering and Electronics, 2008, 30 (12): : 2512 - 2515
- [27] Success Ratio Sequential Test Plan Using Development Test Data PROCEEDINGS OF 2009 8TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY, VOLS I AND II: HIGHLY RELIABLE, EASY TO MAINTAIN AND READY TO SUPPORT, 2009, : 370 - +
- [29] An economic reliability test plan with Pareto distribution INTERNATIONAL JOURNAL OF AGRICULTURAL AND STATISTICAL SCIENCES, 2007, 3 (02): : 309 - 317