Time-of-flight technique to examine carrier blocking nature in organic light emitting diode

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机构：
[1] Rahman, Md. Mijanur
[2] Ogawa, Naoki
[3] Miyazaki, Yukimasa
[4] Nakayama, Yasuo
[5] Noguchi, Yutaka
[6] Ishii, Hisao
来源：
Rahman, M.M. (mijanur@graduate.chiba-u.jp) | 2012年 / The Japan Society of Vacuum and Surface Science卷 / 10期
关键词：
Carrier blocking - Charge carrier behaviors - Displacement current measurements - Organic electronic devices - Time of flight;
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