Non-Destructive Hardware Trojan Circuit Screening by Backside Near Infrared Imaging

被引：0

作者：

Sakamoto, Junichi ^{[1
]}

Sakane, Hirofumi ^{[1
]}

Hori, Yohei ^{[1
]}

Kawamura, Shinichi ^{[1
]}

Hayashi, Yuichi ^{[1
,2
]}

Nagata, Makoto ^{[1
,3
]}

机构：

[1] National Institute of Advanced Industrial Science and Technology, 2-6 Aomi, Koto-ku, Tokyo,135-0064, Japan

[2] Nara Institute of Science and Technology, 8916-5 Takayama-cho, Ikoma-shi,630-0192, Japan

[3] Kobe University, 1- Rokkodai-cho, Nada-ku, Kobe,657-8501, Japan

来源：

2023 IEEE Physical Assurance and Inspection of Electronics, PAINE 2023 | 2023年

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

Computer circuits - Data mining - Hardware security - Infrared devices - Inspection - Integrated circuit design - Integrated circuits - Malware - Scanning electron microscopy - Supply chains - Thermography (imaging)

引用

共 50 条

[1] Non-Destructive Hardware Trojan Circuit Screening by Backside Near Infrared Imaging
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[J]. 2023 IEEE PHYSICAL ASSURANCE AND INSPECTION OF ELECTRONICS, PAINE, 2023, : 184 - 190
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