Reliability Prediction Methods for Electronic Devices: A State-of-the-art Review

被引：0
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作者：
Kumar, Vinay [1 ]
Singh, Lalit Kumar [2 ]
Tripathi, Anil Kumar [2 ]
机构：
[1] National Institute of Technology Jamshedpur, Jharkhand, India
[2] Computer Science & Engineering Department, Indian Institute of Technology (BHU), Varanasi,221 005, India
来源：
IETE Technical Review (Institution of Electronics and Telecommunication Engineers, India) | 2022年 / 39卷 / 02期
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页码：460 / 470
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