Radiation tolerance of a single-photon counting complementary metal-oxide semiconductor image sensor

被引:0
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作者
Gallagher, Justin P. [1 ]
Buntic, Lazar [1 ]
Deng, Wei [2 ]
Fossum, Eric R. [2 ]
Figer, Donald F. [1 ]
机构
[1] Rochester Institute of Technology, Center for Detectors, Rochester,NY, United States
[2] Dartmouth College, Thayer School of Engineering, Hanover,NH, United States
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D O I
10.1117/1.JATIS.10.3.036003
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摘要
76
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