Radiation tolerance of a single-photon counting complementary metal-oxide semiconductor image sensor

被引:0
|
作者
Gallagher, Justin P. [1 ]
Buntic, Lazar [1 ]
Deng, Wei [2 ]
Fossum, Eric R. [2 ]
Figer, Donald F. [1 ]
机构
[1] Rochester Institute of Technology, Center for Detectors, Rochester,NY, United States
[2] Dartmouth College, Thayer School of Engineering, Hanover,NH, United States
关键词
D O I
10.1117/1.JATIS.10.3.036003
中图分类号
学科分类号
摘要
76
引用
收藏
相关论文
共 50 条
  • [1] Single-photon imaging in complementary metal oxide semiconductor processes
    Charbon, E.
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2014, 372 (2012):
  • [2] Real-time rolling shutter compensation for a complementary metal-oxide semiconductor image sensor
    Lee, Yun Gu
    OPTICAL ENGINEERING, 2018, 57 (10)
  • [3] Effect of Proton Irradiation on Complementary Metal Oxide Semiconductor (CMOS) Single-Photon Avalanche Diodes
    Xun, Mingzhu
    Li, Yudong
    Feng, Jie
    He, Chengfa
    Liu, Mingyu
    Guo, Qi
    Caputo, Domenico
    ELECTRONICS, 2024, 13 (01)
  • [4] Complementary metal-oxide-semiconductor image sensor with microchamber array for fluorescent bead counting
    Sasagawa, Kiyotaka
    Ando, Keisuke
    Kobayashi, Takuma
    Noda, Toshihiko
    Tokuda, Takashi
    Kim, Soo Hyeon
    Iino, Ryota
    Noji, Hiroyuki
    Ohta, Jun
    Japanese Journal of Applied Physics, 2012, 51 (2 PART 2)
  • [5] Complementary Metal-Oxide-Semiconductor Image Sensor with Microchamber Array for Fluorescent Bead Counting
    Sasagawa, Kiyotaka
    Ando, Keisuke
    Kobayashi, Takuma
    Noda, Toshihiko
    Tokuda, Takashi
    Kim, Soo Hyeon
    Iino, Ryota
    Noji, Hiroyuki
    Ohta, Jun
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2012, 51 (02)
  • [6] Complementary metal-oxide semiconductor compatible capacitive barometric pressure sensor
    Nie, Meng
    Huang, Qing-An
    Yu, Hui-Yang
    Qin, Ming
    Li, Wei-Hua
    JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, 2011, 10 (01):
  • [7] Electro-optical Characterisation of a Complementary Metal-Oxide Semiconductor Image Sensor for Optical Imaging Application
    Rosli, Nurul Farah
    Rahman, A. T. Abdul
    Zin, Hafiz M.
    JURNAL FIZIK MALAYSIA, 2018, 39 (01): : 10011 - 10016
  • [8] Thick detection zone single-photon avalanche diode fabricated in 0.35 μm complementary metal-oxide semiconductors
    Steindl, Bernhard
    Enne, Reinhard
    Zimmermann, Horst
    OPTICAL ENGINEERING, 2015, 54 (05)
  • [9] RADIATION TESTING COMPLEMENTARY (SYMMETRY) METAL-OXIDE SEMICONDUCTOR (CMOS) ARRAYS FOR SATELLITES
    MATTEUCCI, AJ
    SCHNEIDER, MF
    IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (06) : 2285 - 2288
  • [10] Polarisation analysing complementary metal-oxide semiconductor image sensor in 65-nm standard CMOS technology
    2013, Institution of Engineering and Technology, United States (2013):