In situ X-ray diffraction evidence of field-induced transitions in a PbHfO3 single crystal

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作者
Arkhipov, Nickolay [1 ]
Ganzha, Alexander [1 ]
Kniazeva, Maria [1 ]
Vakulenko, Alexander [1 ]
Filimonov, Alexey [1 ]
Burkovsky, Roman [1 ]
机构
[1] Peter the Great Saint-Petersburg Polytechnic University, 29 Politekhnicheskaya, St. Peterburg,195251, Russia
关键词
Antiferroelectric (AFE) materials are interesting due to recent discoveries of new prospective applications; although the mechanisms of the phase transitions that are at the heart of these applications remain incompletely understood. This work is devoted to the study of a single crystal of a model AFE; lead hafnate; by X-ray diffraction with in situ application of an electric field to trigger the transition to a polar phase. Two consecutive experiments were carried out on a 35μm thick plate with [110] surface normal orientation over a field range from 0 to 330kVcm-1 and back. A sharp drop in the intensity of R- and Σ-type reflections around 225kVcm-1 was registered; with almost complete disappearance after 250kVcm-1. This is compatible with a field-induced phase transition from the AFE to the R3m polar phase; which was suggested earlier on the basis of non-diffraction characterizations. X-ray diffraction reveals that the AFE domains with displacements parallel to the field direction react much more smoothly to the field; gradually reducing the AFE order at very small fields instead of holding it almost constant up to the critical field value; which is naturally expected. This expectation is fulfilled for domains with other orientations; but only for the first switching cycle; in the second switching cycle the AFE order already shows a notable decrease at subcritical fields. It is suggested that these observations could be linked with the antiphase domain wall population being affected by the field; which is consistent with the observation of diffuse rods between the Γ and Σ points. Another remarkable observation is the much smoother recovery of the AFE phase compared with its sharp disappearance at the critical field. © 2024 International Union of Crystallography. All rights reserved;
D O I
10.1107/S1600576724006393
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页码:1184 / 1191
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