Shaping the Future: Innovations in Silicon Wafer Production and Finishing

被引:1
|
作者
Kainth, Shagun [1 ]
Sharma, Piyush [2 ]
Diwan, P. K. [3 ]
Pandey, O. P. [4 ]
机构
[1] Lovely Profess Univ, Sch Chem Engn & Phys Sci, Phagwara 144411, India
[2] Lovely Profess Univ, Sch Mech Engn, Phagwara 144411, India
[3] Kurukshetra Univ, Dept Appl Sci, UIET, Kurukshetra 136119, India
[4] Thapar Inst Engn & Technol, Dept Phys & Mat Sci, Patiala 147004, India
基金
英国科研创新办公室;
关键词
Silicon wafers; Integrated circuits; Czochralski method; Semiconductor manufacturing; Wafer production advancements; CZOCHRALSKI SILICON; TECHNOLOGY; GROWTH; SYSTEM; COST; TEMPERATURE; IMPROVEMENT; IMPURITIES; EFFICIENCY; REMOVAL;
D O I
10.1007/s12633-024-03168-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Silicon wafers are essential components in the production of various devices, including integrated circuits, microchips, and solar cells. The quality and characteristics of silicon wafers greatly influence the performance and reliability of these devices. Silicon wafers have been produced through processes like the Czochralski method, which involves growing a single crystal ingot of silicon and then slicing it into thin wafers. While effective, these methods have limitations in terms of scalability, cost, and uniformity. Recent advancements in silicon wafer production focus on improving efficiency, reducing costs, and enhancing quality. The innovations in silicon wafer production and finishing have significant implications for various industries, including electronics, telecommunications, automotive, and renewable energy. This article provides an overview of the production of high-purity silicon, a vital component in semiconductor device manufacturing. A comprehensive description related to the extraction of silicon from silica, the refinement of metallurgical grade silicon (MGS) to achieve high purity. Additionally, the article covers various processes involved in silicon wafer manufacturing, including cutting, shaping, polishing, and cleaning, and explores advancements in technology that could enhance wafer manufacturing capabilities.
引用
收藏
页码:6479 / 6497
页数:19
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