Near-field optical recording of photochromic materials using bent cantilever fiber probes

被引:0
|
作者
Kim, Jeongyong [1 ,3 ]
Song, Ki-Bong [1 ]
Park, Kang-Ho [2 ]
Lee, Hyo Won [1 ]
Kim, Eunkyoung [2 ]
机构
[1] Basic Research Laboratory, Telecommunications Research Institute, Kajeong-dong 161, Yusong, Taejon 305-600, Korea, Republic of
[2] Department of Physics, University of Incheon, Dohwa-dong 177, Nam-ku, Incheon 402-749, Korea, Republic of
[3] Advanced Materials Division, Korea Research Institute of Chemical Technology, Jang-dong 100, Yusong, Taejon 305-600, Korea, Republic of
关键词
D O I
10.1143/jjap.41.5222
中图分类号
学科分类号
摘要
Optical recording
引用
收藏
页码:5222 / 5225
相关论文
共 50 条
  • [21] Plasmon Polariton Imaging Characteristics of Near-Field Optical Fiber Probes
    J. Seidel
    [J]. Plasmonics, 2013, 8 : 1241 - 1243
  • [22] Electroless silver plating for metallization of near-field optical fiber probes
    李昌安
    徐丽娜
    顾宁
    [J]. Chinese Optics Letters, 2007, (10) : 594 - 595
  • [23] Near-field optical imaging properties by passive and active fiber probes
    Zhang, GP
    Ming, H
    Bai, M
    Chen, XG
    Wu, YX
    Xie, JP
    [J]. AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II, 1998, 3558 : 413 - 420
  • [24] Electroless silver plating for metallization of near-field optical fiber probes
    Li, Chang'an
    Xu, Lina
    Gu, Ning
    [J]. CHINESE OPTICS LETTERS, 2007, 5 (10) : 594 - 595
  • [25] Plasmon Polariton Imaging Characteristics of Near-Field Optical Fiber Probes
    Seidel, J.
    [J]. PLASMONICS, 2013, 8 (02) : 1241 - 1243
  • [26] Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes
    Hermann, Richard J.
    Gordon, Michael J.
    [J]. ANNUAL REVIEW OF CHEMICAL AND BIOMOLECULAR ENGINEERING, VOL 9, 2018, 9 : 365 - 387
  • [27] Ultrasharp carbon whisker optical fiber probes for scanning near-field optical microscopy
    Mensi, Mounir
    Mikhailov, Gennadii
    Pyatkin, Sergey
    Adamcik, Jozef
    Sekatskii, Sergey
    Dietler, Giovanni
    [J]. NANOPHOTONICS III, 2010, 7712
  • [28] Analysis of fiber probes of scanning near-field optical microscope by field emission microscopy
    Sekatskii, SK
    Mironov, BN
    Lapshin, DA
    Dietler, G
    Letokhov, VS
    [J]. ULTRAMICROSCOPY, 2001, 89 (1-3) : 83 - 87
  • [29] Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy
    Werner, S
    Rudow, O
    Mihalcea, C
    Oesterschulze, E
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S367 - S370
  • [30] Cantilever probes with aperture tips for polarization-sensitive scanning near-field optical microscopy
    S. Werner
    O. Rudow
    C. Mihalcea
    E. Oesterschulze
    [J]. Applied Physics A, 1998, 66 : S367 - S370