Characterization of diffraction patterns directly from in-line holograms with the fractional Fourier transform

被引：0
|
作者：
Coëtmellec, Sébastien [1 ]
Lebrun, Denis [1 ]
Özkul, Cafer [1 ]
机构：
[1] G2O, Complexe de RIAT, Unite Mixte de RTM, Avenue de l'Université, 76801 Saint Etienne du Rouvray Cedex, France
来源：
Applied Optics | 2002年 / 41卷 / 02期
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摘要：
25
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页码：312 / 319
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