Measuring flatness [4] (multiple letters)

被引：0
|
作者：
Ramsdell, Sara D. [1 ]
机构：
[1] Concrete Quality Consulting, Lexington, KY, United States
来源：
Concrete Construction - World of Concrete | 2002年 / 47卷 / 10期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：16 / 18
相关论文
共 50 条
  • [41] MEASURING FLATNESS OF LARGE TABLES - NEW METHODS
    RANEASANDOVAL, HF
    GALLARDO, M
    APPLIED OPTICS, 1986, 25 (09): : 1370 - 1371
  • [42] Flatness Defects in Cold-Rolled Strip and Testing of a Flatness Measuring Device.
    Berger, Bernd
    Thies, Helmut
    Neuscheutz, Eberhard
    1600, (95):
  • [43] Deflection Compensation Model for Flatness Measuring Roll
    Liu Jia-wei
    Zhang Dian-hua
    Wang Jun-sheng
    Wang Peng-fei
    JOURNAL OF IRON AND STEEL RESEARCH INTERNATIONAL, 2010, 17 (12) : 35 - +
  • [44] An in-situ method for measuring the wafer flatness
    Zhang, Dongqing
    Wang, Xiangzhao
    Shi, Weijie
    Guangzi Xuebao/Acta Photonica Sinica, 2006, 35 (12): : 1975 - 1979
  • [45] Topometric on-line flatness measuring system for the control of hot strip flatness.
    Degner, M
    Holzknecht, N
    Mentrup, HC
    Muller, U
    Thiemann, G
    Winter, D
    STAHL UND EISEN, 1998, 118 (04): : 79 - +
  • [46] An instrument for measuring flatness by using laser and CCD
    Hao, Q
    Cao, M
    Li, DC
    FLATNESS, ROUGHNESS, AND DISCRETE DEFECT CHARACTERIZATION FOR COMPUTER DISKS, WAFERS, AND FLAT PANEL DISPLAYS, 1996, 2862 : 183 - 186
  • [47] FIZEAU INTERFEROMETER FOR MEASURING FLATNESS OF OPTICAL SURFACES
    BUNNAGEL, R
    OEHRING, HA
    STEINER, K
    APPLIED OPTICS, 1968, 7 (02): : 331 - &
  • [48] Deflection Compensation Model for Flatness Measuring Roll
    LIU Jia-wei1
    2.Anshan Iron and Steel Company
    JournalofIronandSteelResearch(International), 2010, 17 (12) : 35 - 37
  • [49] INSTRUMENT FOR MEASURING DEVIATIONS FROM LINEARITY AND FLATNESS
    LEVIN, BM
    LEONTEVA, GV
    MEASUREMENT TECHNIQUES, 1972, 15 (07) : 1028 - 1029
  • [50] Anodize voltage for 7075 aluminum [4] (multiple letters)
    Anderson, Ryan
    Mooney, Ted
    2002, Elsevier USA, Orlando, United States (100)
12345