Low-power scan testing for test data compression using a routing-driven scan architecture

A new scan architecture is proposed to reduce peak test power and capture power. Only a subset of scan flip-flops are activated to shift test data or capture test responses in any clock cycle. This can effectively reduce the capture test power and peak test power. Two routingdriven schemes are proposed to reduce the routing overhead. Experimental results show that the proposed scan architecture can effectively reduce peak test power, capture power, test data volume, and test application cost. © 2009 IEEE.