Silicon carbide schottky barrier diode

被引:0
|
作者
Zhao, Jian H. [1 ]
Sheng, Kuang [1 ]
Lebron-Velilla, Ramon C. [2 ]
机构
[1] SiCLAB, Rutgers University, 94 Brett Road, Piscataway, NJ 08854, United States
[2] NASA Glenn Research Center, 21000 Brookpark Road, Cleaveland, OH 44135, United States
关键词
D O I
10.1142/S0129156405003430
中图分类号
学科分类号
摘要
195
引用
收藏
页码:821 / 866
相关论文
共 50 条
  • [1] Exploration Of Clipped Barrier Silicon Carbide Schottky Diode
    Wang Zuchuan
    Yao Haiting
    Wu Xiaoye
    2019 INTERNATIONAL CONFERENCE ON SMART GRID AND ELECTRICAL AUTOMATION (ICSGEA), 2019, : 124 - 127
  • [2] Fabrication and Characterization of a Silicon Carbide Based Schottky Barrier Diode
    Shekhawat, Rajesh Singh
    Islam, Sk. Masiul
    Kumar, Sanjeev
    Singh, Sumitra
    Singh, Dheerendra
    Bhattacharya, Sudipta
    JOURNAL OF ELECTRONIC MATERIALS, 2023, 52 (11) : 7221 - 7229
  • [3] Fabrication and Characterization of a Silicon Carbide Based Schottky Barrier Diode
    Rajesh Singh Shekhawat
    Sk. Masiul Islam
    Sanjeev Kumar
    Sumitra Singh
    Dheerendra Singh
    Sudipta Bhattacharya
    Journal of Electronic Materials, 2023, 52 : 7221 - 7229
  • [4] Technical Research on High Power Silicon Carbide Schottky Barrier Diode
    Wang Zuchuan
    Yao Haiting
    Wu Xiaoye
    2019 INTERNATIONAL CONFERENCE ON SMART GRID AND ELECTRICAL AUTOMATION (ICSGEA), 2019, : 46 - 48
  • [5] Proton irradiation damage in silicon carbide junction barrier Schottky diode
    Liu C.
    Li Z.
    Han J.
    Guo G.
    Yin Q.
    Zhang Y.
    Liu J.
    He Jishu/Nuclear Techniques, 2023, 46 (02):
  • [6] Investigation of Thermal Runaway of Reverse-Biased Silicon Carbide Schottky Barrier Diode
    Nakagawa, M.
    Mori, S.
    Nanen, Y.
    Aketa, M.
    Asahara, H.
    Nakamura, T.
    2017 IEEE INTERNATIONAL MEETING FOR FUTURE OF ELECTRON DEVICES, KANSAI (IMFEDK), 2017, : 90 - 91
  • [7] Transient temperature measurement of silicon carbide Schottky barrier diode based on thermal reflection
    Wang, Jingxuan
    Zhou, Lixing
    Meng, Xianwei
    Cheng, Haoxuan
    Feng, Shiwei
    Zhang, Yamin
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2024, 95 (06):
  • [8] 6.5kV Silicon Carbide Discontinuous Trenched Junction Barrier Schottky Diode
    Chen, Zhiyu
    Li, Xuan
    Deng, Xiaochuan
    Li, Juntao
    Li, Zhiqiang
    Zhang, Yourun
    Zhang, Bo
    2019 16TH CHINA INTERNATIONAL FORUM ON SOLID STATE LIGHTING & 2019 INTERNATIONAL FORUM ON WIDE BANDGAP SEMICONDUCTORS CHINA (SSLCHINA: IFWS), 2019, : 33 - 36
  • [9] Evaluation of parallel and series connection of silicon carbide schottky barrier diode (SiC-SBD)
    Kodani, K
    Matsumoto, T
    Saito, S
    Takao, K
    Mogi, T
    Yatsuo, T
    Arai, K
    PESC 04: 2004 IEEE 35TH ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-6, CONFERENCE PROCEEDINGS, 2004, : 2971 - 2976
  • [10] Physics-based spice model on the dynamic characteristics of silicon carbide Schottky barrier diode
    Zhou, Xintian
    Wang, Yan
    Yue, Ruifeng
    Dai, Gang
    Li, Juntao
    IET POWER ELECTRONICS, 2016, 9 (15) : 2803 - 2807