An improved SIFT image tamper forensics method

被引：0
|
作者：
Huang, Huifen [1 ,2 ]
He, Yonghui [2 ]
Liu, Qingmin [3 ]
机构：
[1] Shandong University, School of Information Engineering, Jinan,Shandong,250101, China
[2] Shandong Yingcai University, School of Information Engineering, Jinan,Shandong,250104, China
[3] Shandong University, School of Control Science and Engineering, Jinan,Shandong,250061, China
来源：
International Journal of Circuits, Systems and Signal Processing | 2018年 / 12卷
关键词：
This work was supported in part by The Natural Science Foundation of Shandong Province (No. ZR2015JL023; No; ZR2016FQ23; Shandong Social Science Planning Project(No. 17CHLJ44); Higher Education Research Project of Shandong Province (No. J17KA085; J16LN55); Shandong Statistical Research Project(No.KT16033);
D O I：
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中图分类号：
学科分类号：
摘要：
5
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页码：143 / 146
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