AI at the service of magnetic particle and penetrant inspection

被引：0
|
作者：
Mafille, Yannick [1 ]
Julien, Quentin [1 ]
Valentin, Antoine [1 ]
Bouteille, Patrick [2 ]
机构：
[1] Cetim, Pôle Industrie du Futur (IDF), Mulhouse, France
[2] Cetim, Pôle Monitoring Contrôle Objets Connectés (MCO), Senlis, France
来源：
e-Journal of Nondestructive Testing | 2023年 / 28卷 / 09期
关键词：
Compilation and indexing terms; Copyright 2025 Elsevier Inc;
D O I：
10.58286/28464
中图分类号：
学科分类号：
摘要：
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