Measuring the wavelength of light with a ruler

被引：0
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作者：
机构：
[1] Iizuka, Keigo
来源：
Iizuka, K. (keigo.iizuka@utoronto.ca) | 2005年 / Optical Society of America (OSA)卷 / 16期
关键词：
Diffraction patterns - Output power - Path length - Wavelength measurement;
D O I：
10.1364/OPN.16.6.000025
中图分类号：
学科分类号：
摘要：
(Edited Abstract)
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