Measuring the wavelength of light with a ruler

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作者：

机构：

[1] Iizuka, Keigo

来源：

Iizuka, K. (keigo.iizuka@utoronto.ca) | 2005年 / Optical Society of America (OSA)卷 / 16期

关键词：

Diffraction patterns - Output power - Path length - Wavelength measurement;

D O I：

10.1364/OPN.16.6.000025

中图分类号：

学科分类号：

摘要：

(Edited Abstract)

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