Fabric defect detection based on window threshold local binary patterns

被引：0
|
作者：
Fu, Rong [1 ,2 ]
Shi, Mei-Hong [1 ]
Xu, Bu-Gao [3 ]
机构：
[1] School of Computer Science, Xi'an Polytechnic University, Xi'an 710048, China
[2] School of Electronic Engineering, Xidian University, Xi'an 710075, China
[3] Department of Human Ecology, University of Texas at Austin, Texas 78712, United States
来源：
Jisuanji Jicheng Zhizao Xitong/Computer Integrated Manufacturing Systems, CIMS | 2010年 / 16卷 / 09期
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页码：2009 / 2015
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