Fabric defect detection based on window threshold local binary patterns

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作者
Fu, Rong [1 ,2 ]
Shi, Mei-Hong [1 ]
Xu, Bu-Gao [3 ]
机构
[1] School of Computer Science, Xi'an Polytechnic University, Xi'an 710048, China
[2] School of Electronic Engineering, Xidian University, Xi'an 710075, China
[3] Department of Human Ecology, University of Texas at Austin, Texas 78712, United States
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页码:2009 / 2015
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