An approach to measure pixel pitch of CCD Camera System by using structure diffraction of TFT-LCD

被引：0
|
作者：
Hu, Wen-Gang [1 ]
Wang, Yong-Zhong [1 ]
Hua, Wen-Shen [1 ]
机构：
[1] Department of Optical and Electronic Engineering, Ordnance Engineering College, Shijiazhuang 050003, China
来源：
Guangzi Xuebao/Acta Photonica Sinica | 2008年 / 37卷 / 06期
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学科分类号：
摘要：
Diffraction
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页码：1242 / 1245
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