Quantitative evaluation of statistical errors in small-angle X-ray scattering measurements

被引：0

作者：

Sedlak, Steffen M. ^{[1
]}

Bruetzel, Linda K. ^{[1
]}

Lipfert, Jan ^{[1
]}

机构：

[1] Department of Physics, Nanosystems Initiative Munich, Center for NanoScience, LMU Munich, Amalienstrasse 54, Munich,80799, Germany

来源：

Journal of Applied Crystallography | 2017年 / 50卷 / 02期

关键词：

Measurement errors - X ray detectors;

D O I：

暂无

中图分类号：

O572 [高能物理学];

学科分类号：

摘要：

引用

页码：621 / 630

共 50 条

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