共 50 条
- [1] 3D Stacking Process Technologies for Advanced CMOS Image Sensors2024 INTERNATIONAL VLSI SYMPOSIUM ON TECHNOLOGY, SYSTEMS AND APPLICATIONS, VLSI TSA, 2024,Kagawa, Yoshihisa论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, JapanManda, Shuji论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, JapanIkegami, Yukako论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, JapanKamei, Takahiro论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, JapanShimizu, Kan论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, JapanIwamoto, Hayato论文数: 0 引用数: 0 h-index: 0机构: Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan Sony Semicond Solutions Corp, Atsugi, Kanagawa, Japan
- [2] Advanced 3D Technologies and Architectures for 3D Smart Image Sensors2019 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), 2019, : 674 - 679Vivet, Pascal论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, France CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceSicard, Gilles论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceMillet, Laurent论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceChevobbe, Stephane论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceBen Chehida, Karim论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceMonteAlegre, Luis Angel Cubero论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceBouvier, Maxence论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceValentian, Alexandre论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceLepecq, Maria论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceDombek, Thomas论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceBichler, Oliver论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceThuries, Sebastian论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceLattard, Didier论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceSeverine, Cheramy论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceBatude, Perrine论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, FranceClermidy, Fabien论文数: 0 引用数: 0 h-index: 0机构: CEA, LETI, Minatec Campus, F-38054 Grenoble, France
- [3] Exploring the 3D integration technology for CMOS image sensors2013 IEEE 11TH INTERNATIONAL WORKSHOP OF ELECTRONICS, CONTROL, MEASUREMENT, SIGNALS AND THEIR APPLICATION TO MECHATRONICS (ECMSM), 2013,Raymundo, Fernando论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, FranceMartin-Gonthier, Phillipe论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, FranceMolina, Romain论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, FranceRolando, Sebastien论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, FranceMagnan, Pierre论文数: 0 引用数: 0 h-index: 0机构: Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France Univ Toulouse, CIMI Image Sensor Lab, ISAE, F-31055 Toulouse, France
- [4] Pixel Aperture Technique in CMOS Image Sensors for 3D ImagingSENSORS AND MATERIALS, 2017, 29 (03) : 235 - 241论文数: 引用数: h-index:机构:Bae, Myunghan论文数: 0 引用数: 0 h-index: 0机构: Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South Korea论文数: 引用数: h-index:机构:Lee, Jimin论文数: 0 引用数: 0 h-index: 0机构: Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South KoreaOh, Chang-Woo论文数: 0 引用数: 0 h-index: 0机构: Kyungpook Natl Univ, Dept Sensor & Display Engn, 80 Daehak Ro, Daegu 41566, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South KoreaSeo, Sang-Ho论文数: 0 引用数: 0 h-index: 0机构: Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South KoreaChang, Seunghyuk论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Ctr Integrated Smart Sensors, 291 Daehak Ro, Daejeon 34141, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South KoreaPark, JongHo论文数: 0 引用数: 0 h-index: 0机构: Korea Adv Inst Sci & Technol, Ctr Integrated Smart Sensors, 291 Daehak Ro, Daejeon 34141, South Korea Kyungpook Natl Univ, Sch Elect Engn, 80 Daehak Ro, Daegu 41566, South Korea论文数: 引用数: h-index:机构:
- [5] Study of 3D Process Impact on Advanced CMOS Devices2013 EUROPEAN MICROELECTRONICS PACKAGING CONFERENCE (EMPC), 2013,La Manna, A.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumGuo, W.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumVan Huylenbroeck, S.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumSirignano, E.论文数: 0 引用数: 0 h-index: 0机构: Univ Naples Federico II, I-80125 Naples, Italy IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumCherman, V.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumVan der Plas, G.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumDe Wachter, B.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumPhommahaxay, A.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumJourdain, Anne论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumBeyer, G.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, BelgiumBeyne, E.论文数: 0 引用数: 0 h-index: 0机构: IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium IMEC, Kapeldreef 75, B-3001 Heverlee, Belgium
- [6] 3D Sequential Process Integration for CMOS Image Sensor2021 IEEE INTERNATIONAL ELECTRON DEVICES MEETING (IEDM), 2021,Nakazawa, K.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanYamamoto, J.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanMori, S.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanOkamoto, S.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanShimizu, A.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanBaba, K.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanFujii, N.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanUehara, M.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanHiramatsu, K.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanKumano, H.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanMatsumoto, A.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanZaitsu, K.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanOhnuma, H.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanTatani, K.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanHirano, T.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, JapanIwamoto, H.论文数: 0 引用数: 0 h-index: 0机构: SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan SONY Semicond Solut Corp, Atsugi, Kanagawa, Japan
- [7] Process Integration of 3D Stacking for Backside Illuminated Image Sensor2014 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), 2014, : 82 - 85Hsiao, Zhi-Cheng论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanKo, Cheng-Ta论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanChang, Hsiang-Hung论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanFu, Huan-Chun论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanHsu, Chao-Kai论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanLi, Shu-Man论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanTsai, Wen-Li论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanShen, Wen-Wei论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanWang, Jen-Chun论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanLin, Yu-Min论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, TaiwanLo, Wei-Chung论文数: 0 引用数: 0 h-index: 0机构: Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan Ind Technol Res Inst, Elect & Optoelect Res Labs, Hsinchu, Taiwan
- [8] Enabling technologies for 3D chip stacking2008 INTERNATIONAL SYMPOSIUM ON VLSI TECHNOLOGY, SYSTEMS AND APPLICATIONS (VLSI-TSA), PROCEEDINGS OF TECHNICAL PROGRAM, 2008, : 76 - 78Leduc, Patrick论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceDi Cioccio, Lea论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceCharlet, Barbara论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceRousseau, Maxime论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceAssous, Myriamn论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceBouchu, David论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceRoule, Anne论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceZussy, Marc论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceGueguen, Pierric论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceRoman, Antonio论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceRozeau, Olivier论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceHeitzmann, Michel论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceNieto, Jean-Pierre论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceVandroux, Laurent论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceHaumesser, Paul-Henri论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceQuenouillere, Remi论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceToffoli, Alain论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceSixt, Pierre论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceMaitrejean, Sylvain论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceClavelier, Laurent论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, FranceSillon, Nicolas论文数: 0 引用数: 0 h-index: 0机构: CEA Leti Minatec, F-38054 Grenoble 9, France CEA Leti Minatec, F-38054 Grenoble 9, France
- [9] The Challenges of Advanced CMOS Process from 2D to 3DAPPLIED SCIENCES-BASEL, 2017, 7 (10):Radamson, Henry H.论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Microelect Inst, Beijing 100049, Peoples R China KTH Royal Inst Technol, Sch ICT, Isafjordsgatan 22, S-16440 Stockholm, Sweden Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaZhang, Yanbo论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaHe, Xiaobin论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaCui, Hushan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaLi, Junjie论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaXiang, Jinjuan论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaLiu, Jinbiao论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaGu, Shihai论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R ChinaWang, Guilei论文数: 0 引用数: 0 h-index: 0机构: Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China Univ Chinese Acad Sci, Microelect Inst, Beijing 100049, Peoples R China Chinese Acad Sci, Inst Microelect, Key Lab Microelect Devices & Integrated Technol, Beijing 100029, Peoples R China
- [10] TSV and 3D Wafer Bonding Technologies For Advanced Stacking System and Application at ITRI2009 SYMPOSIUM ON VLSI TECHNOLOGY, DIGEST OF TECHNICAL PAPERS, 2009, : 70 - +Lo, Wei-Chung论文数: 0 引用数: 0 h-index: 0Chen, Yu-Hua论文数: 0 引用数: 0 h-index: 0Ko, Cheng-Ta论文数: 0 引用数: 0 h-index: 0Kao, Ming-Ger论文数: 0 引用数: 0 h-index: 0