Theorems on the variable-length intrinsic randomness

被引:9
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作者
机构
[1] [1,Sun Han, Te
来源
Han, Te Sun | 1600年 / IEEE, Piscataway, NJ, United States卷 / 46期
关键词
Approximation theory - Random processes - Spectrum analysis - Variational techniques;
D O I
10.1109/18.868481
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摘要
In this paper we address variable-length intrinsic randomness problems (in the sense of Vembu and Verdu) for countably infinite source alphabet X under the (unnormalized) divergence distance, the normalized conditional divergence distance, and the variational distance. It turns out that under all three kinds of approximation measures the variable-length intrinsic randomness still takes the same value, called the inf-entropy rate of the source.
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